@article{matt2014thickness,
  title = {Thickness Dependent Optical Parameters of Vacuum Evaporated Cadmium Telluride Thin Films},
  author = {Mahesh Hampapatna Matt and Naveen Chickmagalur Shivappa and Raghu Patel and Shailaja Jeetendra },
  year = 2014,
  url = {https://ibimapublishing.com/articles/IJREB/2014/791671/},
  journal = {International Journal of Renewable Energy & Biofuels},
  volume = 2014,
  pages = 8,
  doi = 10.5171/2014.791671,
  abstract = {Vacuum evaporated polycrystalline CdTe thin films were deposited on to glass substrates and optical parameters were determined by envelope technique. Thin films were characterized by optical transmission spectroscopy in the spectral range 290 - 1000 nm. The refractive index, extinction coefficient, optical conductivity and loss factor dependency on thickness were evaluated. Thickness dependency of thin films showed direct allowed transition with band gap of 1.43 — 1.50 eV. The Urbach tail width determined near the absorption edge was found to be decreased with thickness indicating the improved grain size. The normalized transmittance standard deviation showed a minimum value of 0.12% for 2 µm and maximum of 0.32% for 1µm thick CdTe films. The surface morphology showed uniform thin films with good stoichiometric values.},
  keywords = {CdTe, vacuum, thickness, optical properties, absorption},
  note = Article ID: 791671
}